X-ray diffractometer
Users of Additiv+ are granted access to our X-ray diffractometer.
Training time for independent use: approximately 16 h
Stresstech Xstress G2R
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The Stresstech Xstress G2R is an X-ray diffractometer for the semi-automatic detection and analysis of surface residual stress profiles. |
| MOS detector resolution | 0.03° - 0.06°/ pixel 2θ angle |
| 2θ range | Continuously adjustable between +100° and 165° |
| X-ray tube | Maximum output: 30 kV at 10 mA = 300 watts |
| Collimator | Interchangeable, spot size: 1, 2, 3, 4, and 5 mm |
| Measuring distance | Variable between 50, 75, and 100 mm |
| Software |
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